Through the NSF major research instrumentation program, we have recently purchased a state-of-the-art surface analysis chamber for X-ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS) and Auger Electron Spectroscopy (AES). The instrument is capable of:

-XPS small area analysis (~10micrometers)

-two-dimensional elemental XPS and AES mapping

-two-dimensional chemical state mapping

-charge neutralization for the analysis of insulating samples

-depth profiling

-automated analysis of hundreds of samples or hundreds of different areas of the same samples

-wide spot size UPS

The instrument has just been recently installed and high quality data are being collected. The instrument is being used in several of our research projects.

Jonas Baltrusaitis stands next to the newly delivered Krato’s Ultra Axis surface analysis chamber. This is a state-of-the-art UHV system with XPS, UPS and AES capabilities.